Non-contact Point Autofocus Probe 3D Measuring Instrument recognized by NASA!
November 14, 2018
The others News Report

#1017. Non-contact Point Autofocus Probe 3D Measuring Instrument recognized by NASA!

     Point Autofocus Probe 3D Measuring Instrument can measure nano-level three dimensional objects including the defect of IC and even finger print.

Point Autofocus Probe 3D Measuring Instrument is an amazing high precision non-contact measuring instrument which can measure nano-level three dimensional objects. The company’s product is authorized by NASA and is known as the fact that it has produced the special camera carried by Space Shuttle COLUMBIA. In the outer space, the device working correctly under the sever conditions ranging from minus 50 degrees C to over 100 degrees C is required. The only camera that could meet that demand was the company’s one. Point Autofocus Probe 3D Measuring Instrument was invented with the purpose of discovering new stars. Now it is indispensable in the electric industry to find the defect of integrated circuit.

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Company/organization/institute
Mitaka Kohki Co., Ltd.
URL
http://www.mitakakohki.co.jp/english/
Contact
http://www.mitakakohki.co.jp/english/contact/
Location
Tokyo

Comments from Organizer

The company's employment policy is employing someone who has a talent to create something from nothing.

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